Meuris, M. ; Izumi, H. ; Kubo, K. ; Ojima, S. ; Ohmi, T. ; Heyns, M.M.
Pub. info.:
Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.444-448, 1995. Pennington, NJ. Electrochemical Society
Nishikawa, J. ; Yoshizawa, M. ; Ohishi, N. ; Suzuki, S. ; Torii, Y. ; Matsuda, K. ; Kubo, K. ; Iwashita, H. ; Yokoi, T. ; Kotani, T. ; Sato, K.
Pub. info.:
New frontiers in stellar interferometry : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.520-527, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.107-114, 1995. Pennington, NJ. Electrochemical Society
Muraki, M. ; Kubo, K. ; Nakanishi, H. ; Hirata, M. ; Matsuo, K. ; Yano, N. ; Takesue, M. ; Ogita, K. ; Watanabe, M. ; Okabe, H.
Pub. info.:
1996 International Fall Fuels and Lubricants Meeting and Exposition : SAE technical paper. pp.137-142, 1996. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:
Society of Automotive Engineers technical paper series
Sato, K. ; Nishikawa, J. ; Yoshizawa, M. ; Ohishi, N. ; Fukushima, T. ; Torii, Y. ; Matsuda, K. ; Kubo, K. ; Iwashita, H. ; Suzuki, S. ; Kotani, T. ; Yokoi, T.
Pub. info.:
Interferometry for Optical Astronomy II. Part Two pp.1072-1079, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yashizawa, M. ; Nishikawa, J. ; Ohishi, N. ; Suzuki, S. ; Torri, Y. ; Iwashita, H. ; Kubo, K. ; Matsuda, K. ; Murakami, N. ; Matsukawa, A. ; Nishimura, T. ; Okayasu, N. ; Watanabe, S.
Pub. info.:
Advances in Stellar Interferometry. pp.626808-626808, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering