1.

Conference Proceedings

Conference Proceedings
Chen, C.-J. ; Lai, S.-H. ; Lee, W.-H. ; Lin, C.-Y. ; Ku, T. ; Chen, C.-H. ; Chung, Y.-C.
Pub. info.: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.600008-600008,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6000
2.

Technical Paper

Technical Paper
Nguyen, L.D. ; Ku, T. ; Neri, R.
Pub. info.: 2002 World Aviation Congress and Exposition : SAE technical paper.  2002.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2002
3.

Conference Proceedings

Conference Proceedings
Chen, C. -J. ; Lai, S. -H. ; Liu, S. -W. ; Ku, T. ; Yeh, S. Y. -C.
Pub. info.: Machine Vision Applications in Industrial Inspection XIII.  pp.53-61,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5679