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Conference Proceedings

1. Determination of Crystalline Perfection and Lattice-Mismatch Between Gallium Antimonide Epitaxial Films and Gallium Arsenide Substrates

Goswami,S.Niranjana N. ; Krishan Lal ; Vogt,A. ; Hartnagel,H.L.

Pub. info.:	Physics of - Semiconductor Devices -. Part 1 pp.341-344, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

2. Preparation and Characterization of Gallium Nitride Powder

Trehan,J.C. ; Parashar,D.C. ; Rashmi ; Suri,D.K. ; Krishan Lal

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.1318-1322, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

3. High Resolution X-ray Diffraction Study of Cadmium and Tellurium Surfaces of(111) Cadmium Zinc Telluride Single Crystals

Vijay Kumar ; Krishan Lal ; Gupta,S.C. ; Sreedhar,A.K.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.791-794, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

4. Evaluation of Perfection of Cadmium Telluride and Cadmium Zinc Telluride Substrates

Krishan Lal ; Vijay Kumar ; Sitharaman,S. ; Chavada,F.R. ; Garg,A.K. ; Anjana Nagpal ; Gautam,M. ; Gupta,S.C.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.795-798, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316