1.

Conference Proceedings
Conference Proceedings
1. A novel instrument for measurement of low-level scattering from optical components in the UV region [5965-56]
Krasilnikova, A. ; Bulir, J.
Pub. info.: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.59651I-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5965
2.

Conference Proceedings
Conference Proceedings
2. Spatially resolved spectroscopy for non-uniform thin film coatings: comparison of two dedicated set-ups [5965-70]
Krasilnikova, A. ; Piegari, A. ; Dami, M. ; Abel-Tiberini, L. ; Lemarquis, F. ; Lequime, M.
Pub. info.: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.59651V-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5965
3.

Conference Proceedings
Conference Proceedings
3. Spectral characterization of scattering losses in rf sputtered oxide coatings [5965-69]
Grilli, M. L. ; Krasilnikova, A. ; Menchini, F. ; Piegari, A.
Pub. info.: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.59651U-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5965
4.

Conference Proceedings
Conference Proceedings
4. Low-intensity scatterering detection with commercial spectrophotometers
Masetti, E. ; Krasilnikova, A. ; Bulir, J. ; Ferre-Borrul, J.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.697-705,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
5.

Conference Proceedings
Conference Proceedings
5. Results of a round-robin experiment on reflectivity measurements at a wavelength of 1.06 μm
Nickel, D. ; Fleig, C. ; Erhard, A. ; Letsch, A. ; Giesen, A. ; Jupe, M. ; Starke, K. ; Ristau, D. ; Wilhelm, O. ; Huber, R.A. ; Haspel, R. ; Schuhmann, U. ; Scharfenorth, C. ; Eichler, H.J. ; Gliech, S. ; Duparre, A. ; Schulz-Grosser, M. ; Krasilnikova, A. ; Haise, A. ; Riede, W. ; Balachninaite, O. ; Grigonis, R. ; Sirutkaitis, V. ; Kazakevich, V.
Pub. info.: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.520-526,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4932