Krapels, K.A. ; Driggers, R.G. ; Murrill, S. ; Schuler, J.M. ; Thielke, M. ; Young, S.S.
Pub. info.:
Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA. pp.139-149, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Moyer, S.K. ; Flug, E. ; Edwards, T.C. ; Krapels, K.A. ; Scarbrough, J.
Pub. info.:
Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA. pp.116-126, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering