1.

Conference Proceedings

Conference Proceedings
Pinheiro,M.V.B. ; Krambrook,K. ; Chaves,A.S. ; Wietzke,K.-H. ; Koschnick,F.K. ; Spaeth,J.-M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1315-1320,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Wietzke,K.-H. ; Pinheiro,M.V.B. ; Koschnick,F.K. ; Krambrock,K. ; Spaeth,J.-M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1303-1308,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Ittermann,B. ; Koschnick,F.K. ; Barry,W.A. ; Burnard,M.J. ; Watkins,G.D.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.423-428,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings

Conference Proceedings
Goodrnan,S.A. ; Koschnick,F.K. ; Weber,Ch. ; Spaeth,J .-M. ; Auret,F.D.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1021-1026,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings

Conference Proceedings
Wietzke,K.-H. ; Koschnick,F.K. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1061-1066,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings

Conference Proceedings
Koschnick,F.K. ; Spaeth,J.-M. ; Glaser,E.R. ; Doverspike,K. ; Rowland,L.B. ; Gaskill,D.K. ; Wickenden,D.K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.37-42,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201