1.

Conference Proceedings
Conference Proceedings
1. Improvement of near-field mastering with a 266-nm laser
Imanishi, S. ; Takeda, M. ; Yamamoto, M. ; Mukai, N. ; Takagi, K. ; Kono, T.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.203-208,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069
2.

Conference Proceedings
Conference Proceedings
2. High-speed and efficient control of refractive index change of fused silica by multiwavelength excitation process using F2 and KrF excimer lasers
Obata, K. ; Sugioka, K. ; Kono, T. ; Takai, H. ; Toyoda, K. ; Midorikawa, K.
Pub. info.: Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan.  pp.373-378,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4830
3.

Conference Proceedings
Conference Proceedings
3. CO-DEPOSITION MECHANISM OF TRACE Cu AND Fe ON H-Si (100) SURFACE IN BUFFERED FLUORIDE SOLUTIONS
Homma, T. ; Kono, T. ; Osaka, T. ; Chemla, M. ; Bertagna, V.
Pub. info.: Cleaning technology semiconductor device manufacturing : proceedings of the seventh international symposium.  pp.110-117,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-26
4.

Conference Proceedings
Conference Proceedings
4. Mix-and-match overlay method by compensating dynamic scan distortion error
Kono, T. ; Takakuwa, M. ; Asanuma, K. ; Komine, N. ; Higashiki, T.
Pub. info.: Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA.  pp.221-227,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5378
5.

Technical Paper
Technical Paper
5. A Study of a Gasoline-fueled HCCI Engine. ‘Mode Changes from SI Combustion to HCCI Combustion’
Matsuda, T. ; Wada, H. ; Kono, T. ; Nakamura, T. ; Urushihara, T.
Pub. info.: 2008 SAE world congress : technical paper.  2008.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2008
6.

Technical Paper
Technical Paper
6. Technologies for Practical Application of a TBW System for Large Motorcycle with Improved Driving Feel, Sound Quality, and Layout Flexibility.
Nishimura, S. ; Tetsuka, T. ; Asada, Y. ; Kono, T. ; Tsuyuguchi, M. ; Nojima, S.
Pub. info.: 2010 SAE world congress : technical paper.  2010.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2010
7.

Technical Paper
Technical Paper
7. Research into New Emission Control Techniques for Motorcycles to Achieve the EURO-3 Regulation.
Akamatsu, S. ; Kono, T. ; Miyata, H. ; Uraki, M.
Pub. info.: 2004 Small Engine Technology Conference and Exhibition : SAE technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
8.

Conference Proceedings
Conference Proceedings
8. Basic studies of overlay performance on immersion lithography tool [6154-26]
Shiraishi, K. ; Fujiwara, T. ; Tanizaki, H. ; Ishii, Y. ; Kono, T. ; Nakagawa, S. ; Higashiki, T.
Pub. info.: Optical Microlithography XIX.  pp.61540Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
9.

Conference Proceedings
Conference Proceedings
9. Alignment mark signal simulation system for the optimum mark feature selection
Sato, T. ; Endo, A. ; Higashiki, T. ; Ishigo, K. ; Kono, T. ; Sakamoto, T. ; Shioyama, Y. ; Tanaka, S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.105-113,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375