1.

Technical Paper
Technical Paper
1. Heat Treatments to Improve the Rolling-Contact Fatigue Life for Crank Pin of Motorcycles.
Yamagata, H. ; Koike, T. ; Nino, R. ; Katsura, T. ; Hiraoka, K.
Pub. info.: 2003 SAE world congress : technical paper.  2003.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2003
2.

Technical Paper
Technical Paper
2. Development of Fracture Splitting Method for Case Hardened Connecting Rods.
Kubota, T. ; Iwasaki, S. ; Isobe, T. ; Koike, T.
Pub. info.: 2004 Small Engine Technology Conference and Exhibition : SAE technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
3.

Conference Proceedings
Conference Proceedings
3. Novel methodology of employing scatterometry to assess optical proximity correction test pattern
Asano, M. ; Koike, T. ; Mikami, T. ; Abe, H. ; Ikeda, T. ; Tanaka, S. ; Mimotogi, S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XIX.  pp.9-18,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5752
4.

Conference Proceedings
Conference Proceedings
4. The sidewall angle dependence of CDSEM measurements and its impact on CD process control
Koike, T. ; Asano, M. ; Mikami, T. ; Yamazaki, Y.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XIX.  pp.19-29,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5752
5.

Conference Proceedings
Conference Proceedings
5. Inline CO metrology with combined use of scatterometry and CO-SEM [6152-69]
Asano, M. ; Ikeda, T. ; Koike, T. ; Abe, H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61521V-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
6.

Conference Proceedings
Conference Proceedings
6. Retrieval of surface parameters with microwave remote sensing
Wang, J. ; Gao, F. ; Li, X. ; Koike, T.
Pub. info.: Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land.  Part Two  pp.686-694,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4890
7.

Conference Proceedings
Conference Proceedings
7. Advanced Cr dry etching process
Aoyama, S. ; Sakamoto, S. ; Koike, T. ; Yoshioka, N. ; Harashima, N. ; Hayashi, A. ; Sasaki, T.
Pub. info.: Photomask and X-Ray Mask Technology VI.  pp.137-146,  1999.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3748