1.

Conference Proceedings
Conference Proceedings
1. Systematic Analyses of Practical Problems Related to Defects and Metallic Impurities in Silicon
Kitagawara, Y. ; Takeno, H. ; Tobe, S. ; Hayamizu, Y. ; Koide, T. ; Takenaka, T.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.3-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
2.

Technical Paper
Technical Paper
2. Cutting Tool Identification System for Accident-Free Machining.
Liu, Jiancheng ; Yamazaki, K. ; Koide, T.
Pub. info.: SME technical paper.  2000.  Society of Manufacturing Engineers