Seifert, W. ; Albrecht, H. ; Mietke, S. ; Koehler, T. ; Werner, M.
Pub. info.:
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.183-190, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Werner, M. ; Koehler, T. ; Mietke, S. ; Woerner, E. ; Johnston, C. ; Fecht, H.-J.
Pub. info.:
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.199-210, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering