Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.412-418, 1997. Pennington, NJ. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California. Part1 pp.138-146, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii. Part 1 pp.512-524, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii. Part 1 pp.317-321, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, [California] USA. pp.38-40, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical telescopes of today and tomorrow : following in the direction of Tycho Brahe : 29 May-2 June, 1996, Landskrona/Hven, Sweden. pp.1064-1069, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA. pp.376-383, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA. Part1 pp.531-544, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany. Part2 pp.1056-1066, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.713-716, 1998. Zuerich, Switzerland. Trans Tech Publications