1.

Conference Proceedings

Conference Proceedings
Nomura,A. ; Lin,J. ; Ito,T. ; Kobayashi,F. ; Kawahara,T.D. ; Saito,Y.
Pub. info.: Lider remote sensing for industry and environment monitoring : 9-12 October 2000, Sendai, Japan.  pp.583-590,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4153
2.

Conference Proceedings

Conference Proceedings
Kawahara,T.D. ; Kitahara,T. ; Kobayashi,F. ; Saito,Y. ; Nomura,A.
Pub. info.: Lider remote sensing for industry and environment monitoring : 9-12 October 2000, Sendai, Japan.  pp.264-271,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4153
3.

Conference Proceedings

Conference Proceedings
Toyooka,S. ; Kataguchi,M. ; Hayasaka,N. ; Kobayashi,F.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.207-208,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
4.

Conference Proceedings

Conference Proceedings
Kitahara,T. ; Kawahara,T.D. ; Kobayashi,F. ; Saito,Y. ; Nomura,A.
Pub. info.: Optical remote sensing for industry and environmental monitoring : 15-17 September, 1998, Beijing, China.  pp.275-282,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3504
5.

Conference Proceedings

Conference Proceedings
Ge,Z. ; Kobayashi,F. ; Matsuda,S. ; Takeda,M.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part A  pp.38-46,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101