1.

Conference Proceedings
Conference Proceedings
1. The Analytical Study of Thermal Instability in TiSi2
Yu, S.H. ; Kweon, S.S. ; Paik, J.C. ; Ko, C.G. ; Choi, S.H.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.215-220,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1
2.

Conference Proceedings
Conference Proceedings
2. The Properties of Al Films Deposited by High Temperature Spultering Methods
Yu, S.H. ; Jung, B.H. ; Lee, K.B. ; Kim, H.D. ; Paik, J.S. ; Ko, C.G. ; Cho, S.H.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.181-192,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1