1.

Conference Proceedings
Conference Proceedings
1. Defect Physics Investigations Using Positron and Ion Beams
Simpson, P.J. ; Szpala, S. ; Knights, A.P.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.56-60,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
2.

Conference Proceedings
Conference Proceedings
2. Double Implanted Power MESFET Technology in 4H-SiC
Horsfall, A.B. ; Ortolland, S. ; Wright, N.G. ; Johnson, C.M. ; Knights, A.P.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.707-710,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
3.

Conference Proceedings
Conference Proceedings
3. Physical Characterization of Residual Implant Damage in 4H-SiC Double Implanted Bipolar Technology
Wright, N.G. ; Johnson, C.M. ; O'Neill, A.G. ; Horsfall, A. ; Phelps, G.J. ; Adachi, K. ; Knights, A.P. ; Ortolland, S. ; Coleman, P.G. ; Burrows, C.P.
Pub. info.: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 640
4.

Conference Proceedings
Conference Proceedings
4. Effect of Residual Damage on Carrier Transport Properties in a 4H-SiC Double Implanted Bipolar Junction Transistor
Ortolland, S. ; Wright, N.G. ; Johnson, C.M. ; Knights, A.P. ; Coleman, P.G. ; Burrows, C.P. ; Pidduck, A.J.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.567-570,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
5.

Conference Proceedings
Conference Proceedings
5. Sensitivity of Positron Annihilation Spectroscopy to Energy Contamination in Low Energy Boron Ion Implantation
Knights, A.P. ; Coleman, P.G.
Pub. info.: Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003.  pp.123-125,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 445-446
6.

Conference Proceedings
Conference Proceedings
6. The Role of Impurities in the Formation of Voids in Silicon
Simpson, P.J. ; Knights, A.P.
Pub. info.: Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003.  pp.180-182,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 445-446
7.

Conference Proceedings
Conference Proceedings
7. CMOS compatible vertical directional coupler for 3D optical circuits [5970-17]
Doylend, J.K. ; Knights, A.P. ; Brooks, C. ; Jessop, P.E.
Pub. info.: Photonic Applications in Devices and Communication Systems.  pp.59700G-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5970
8.

Conference Proceedings
Conference Proceedings
8. Erbium doped silicon rich silicon oxide luminescent thin films deposited by ECR-PECVD [5970-118]
Blakie, D. ; Zalloum, O.H.Y. ; Wojcik, J. ; Irving, E.J. ; Knights, A.P. ; Mascher, P.
Pub. info.: Photonic Applications in Devices and Communication Systems.  pp.597013-597013,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5970
9.

Conference Proceedings
Conference Proceedings
9. Recent progress in the design, simulation, and fabrication of small cross-section silicon-on-insulator VOAs (Invited Paper)
Whiteman, R.R. ; Knights, A.P. ; George, D. ; Day, I.E. ; Vonsovici, A. ; House, A.A. ; Hopper, G.F. ; Asghari, M.
Pub. info.: Photonics Packaging and Integration III.  pp.146-156,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4997