1.

Conference Proceedings
Conference Proceedings
1. Optical study of the influence of oxygen on the synthesis of SiC-buried layer in Cz-Si and Fz-Si
Yukhimchuk,V.A. ; Melnik,V.P. ; Romanjuk,B.N. ; Popov,V.G. ; Klyui,N.I.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.375-378,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
2.

Conference Proceedings
Conference Proceedings
2. Diagnostics of nitrogen-implanted diamond-like carbon films by optical and microhardness measurements
Artamonov,V.V. ; Klyui,N.I. ; Romanykuk,B.N. ; Valakh,M.Ya. ; Vasylyk,O.V. ; Semenovich,V.A. ; Perez-Rodriguez,A. ; Morante,J.R.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.339-343,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
3.

Conference Proceedings
Conference Proceedings
3. Diagnostics of Si-Ge alloys by spectroellipsometry
Litovchenko,V.G. ; Frolov,S.I. ; Klyui,N.I. ; Shkarban,B.N. ; Mitus,V.A. ; Kruger,D.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.433-438,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648