1.

Conference Proceedings

Conference Proceedings
Sek,G. ; Ryczko,K. ; Misiewicz,J. ; Bayer,M. ; Klopf,F. ; Reithmaier,J.P. ; Forchel,A.W.B.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.139-142,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Forchel,A.W. ; Kamp,M. ; Reithmaier,J.-P. ; Moosburger,J. ; Happ,T.A. ; Rennon,S. ; Klopf,F. ; Werner,R. ; Oesterle,U. ; Benisty,H. ; Weisbuch,C.
Pub. info.: Physics and Simulation of Optoelectronic Devices IX.  pp.406-414,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4283