1.

Conference Proceedings
Conference Proceedings
1. Extremely High-Density Capacitors with ALD High-k Dielectric Layers
Klootwijk, J. ; Kemmeren, A. ; Wolters, R. ; Roozeboom, F. ; Verhoeven, J. ; Van Den Heuvel, E.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.17-29,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. More Than 'Moore': Towards Passive and Si-Based System-In-Package Integration (Invited)
Roozeboom, F. ; Kemmeren, A.L.A.M. ; Verhoeven, J.F.C. ; van, F.C. ; Heuvel, den ; Klootwijk, J. ; Kretschman, H. ; Fric, T. ; van Grunsven, E.C.E. ; Bardy, S. ; Bunel, C. ; Chevrie, D. ; LeCornec, F. ; Ledain, S. ; Murray, F. ; Philippe, P.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.16-31,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08