1.

Conference Proceedings
Conference Proceedings
1. 128×128 FPAs on MBE-grown CdHgTe layers for medium-and far-IR range
Vasilyev,V.V. ; Dvoretsky,S.A. ; Esaev,D.G. ; Zashariash,T.I. ; Klimenko,A.G. ; Kozlov,A.I. ; Marchishin,I.V. ; Ovsyuk,V.N. ; Talipov,N.H. ; Sidorov,Yu.G. ; Suslyakov,A.O.
Pub. info.: 16th International conference on photoelectronics and night vision devices : 25-27 May 2000 Moscow, Russia.  pp.49-55,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4340
2.

Conference Proceedings
Conference Proceedings
2. 128×128 IR FPA based on GaAs/AlGaAs MQW
Dem'yanenko,M.A. ; Marchishin,I.V. ; Klimenko,A.G. ; Kozlov,A.I. ; Ovsyuk,V.N. ; Savchenko,A.P. ; Toropov,A.I. ; Shashkin,V.V.
Pub. info.: 16th International conference on photoelectronics and night vision devices : 25-27 May 2000 Moscow, Russia.  pp.27-30,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4340
3.

Conference Proceedings
Conference Proceedings
3. Optimization of nanosecond UV laser illumination for semiconductor materials(Si,HgCdTe,InSb)
Novoselov,A.R. ; Klimenko,A.G. ; Fedosenko,E.V. ; Plotnikov,A.E.
Pub. info.: Laser applications in microelectronic and optoelectronic manufacturing V : 24-26 January 2000, San Jose, USA.  pp.432-437,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3933
4.

Conference Proceedings
Conference Proceedings
4. The Definition of Standard Methods Checking Electrophysical Performance of p-n Junction(Si,HgCdTe)on Nanosecond UV Laser Cutting
Novoselov,A.R. ; Klimenko,A.G. ; Esaev,D.C. ; Vasilyev,V.V.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.537-546,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3895
5.

Conference Proceedings
Conference Proceedings
5. 128｡ﾟ128 hybrid FPAs using MBE HgCdTe films on GaAs substrates
Esaev,D.G. ; Klimenko,A.G. ; Kozlov,A.I. ; Marchishin,I.V. ; Ovsyuk,V.N. ; Talipov,N.Kh. ; Zakhariash,T.I. ; Vasiliev,V.V. ; Sidorov,Yu.G. ; Dvoretsky,S.A.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.594-600,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
6.

Conference Proceedings
Conference Proceedings
6. Processes in semiconductor materials after laser cutting
Novoselov,A.R. ; Klimenko,A.G.
Pub. info.: Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore.  pp.150-153,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4426
7.

Conference Proceedings
Conference Proceedings
7. 2×64 linear LWIR arrays based in HgCdTe MBE-grown layers and CCD silicon readouts
Vasilyev,V.V. ; Dvoretsky,S.A. ; Esaev,D.G. ; Zahariyash,T.I. ; Klimenko,A.G. ; Obsyuk,V.N. ; Sidorov,Yu.G. ; Sizov,F.F. ; Reva,V.P. ; Derkach,Yu.P. ; Korinets,S.G. ; Golenkov,A.G. ; Darchuk,S.D. ; Zabudsky,V.V.
Pub. info.: Fifth international conference on material science and material properties for infrared optoelectronics : 22-24 may 2000, Kiev, Ukraine.  pp.48-52,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4355
8.

Conference Proceedings
Conference Proceedings
8. Degradation zones of semiconductor target(Si)formed as a result of nanosecond UV Laser material processing
Novoselov,A.R. ; Klimenko,A.G.
Pub. info.: In-Line Methods and Monitors for Process and Yield Improvement.  pp.269-276,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3884