1.

Conference Proceedings
Conference Proceedings
1. PROPERTIES OF MBE GROWN HETEROSTRUCTURES OF GaAs/InSb AND InP/InSb
Asom, M. T. ; Fitzgerald,m E. A. ; Thiel,. F. A. ; People, R,. ; Eaglesham. D. ; Luther, L. ; Sputz, S. K. ; Kimerling, L. C.
Pub. info.: III-V heterostructures for electronic/photonic devices : symposium held April 24-27, 1989, San Diego, California, U.S.A..  pp.399-404,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 145
2.

Conference Proceedings
Conference Proceedings
2. IDENTIFICATION OF INTERSTITIAL CARBON RELATED DEFECTS IN SILICON
Benton, J. L. ; Asom, M. T. ; Sauer, R. ; Kimerling, L. C.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.85-92,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings
Conference Proceedings
3. INFLUENCE OF OXYGEN AND BORON ON DEFECT PRODUCTION IN IRRADIATED SILICON
Drevinsky, P. J. ; Caefer, C. E. ; Tobin, S. P. ; Mikkelsen Jr., J. C. ; Kimerling, L. C.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.167-172,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
4.

Conference Proceedings
Conference Proceedings
4. THERMAL ANNEALING AND COOLING-RATE DEPENDENT ELECTRONIC PROPERTIES OF BULK GaAs CRVSTALS
Parsey Jr., J. M. ; Asom, M. T. ; Kimerling, L. C. ; Sauer, R. ; Thiel, F. A.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.429-436,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
5.

Conference Proceedings
Conference Proceedings
5. THE EFFECT OF UNIAXIAL STRESS ON THE INFRARED ABSORPTION BANDS DUE TO THE OXYGEN DONOR IN SILICON
Stavola, M. ; Lee, K. M. ; Freeland, P.E. ; Kimerling, L. C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.257-262,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
6.

Conference Proceedings
Conference Proceedings
6. *DEFECT STRUCTURE AND PROPERTIES BY JUNCTION SPECTROSCOPY
Kimerling, L. C. ; Benton,. J. L. ; Lee, K. M. ; Stavola, M.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.3-12,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
7.

Conference Proceedings
Conference Proceedings
7. In Situ Monitoring of HF Reprocessing in an Industrial Scale Recirculator Bath
Reddy, A. J. ; Norga, G. J. ; Park, A. S. ; Smith, A. L. ; Michel, J. ; Kimerling, L. C. ; Parekh, B. ; Shyu, J-H. ; Deane, E.
Pub. info.: Environmental, safety, and health issues in IC production : symposium held December 4-5, 1996, Boston, Massachusetts, U.S.A..  pp.3-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 447
8.

Conference Proceedings
Conference Proceedings
8. Defects and Future Silicon Technology
Palm, J. ; Kimerling, L. C.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.703-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
9.

Conference Proceedings
Conference Proceedings
9. Gettering of Fe by Aluminum in p-Type Cz Silicon
Ahn, S. H. ; Zhao, S. ; Smith, A. L. ; Chalfoun, L. L. ; Platero, M. ; Nakashima, H. ; Kimerling, L. C.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.169-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
10.

Conference Proceedings
Conference Proceedings
10. Electronically-Enhanced Reaction of Process-Induced Defects in GaAs
Wada, K. ; Nakanishi, H. ; Yamada, K. ; Kimerling, L. C.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.201-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510