1.

Conference Proceedings
Conference Proceedings
1. YBaCuO uncooled microbolometer IRFPA
Wada,H. ; Sone,T. ; Hata,H. ; Nakaki,Y. ; Kaneda,O. ; Ohta,Y. ; Ueno,M. ; Kimata,M.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.297-304,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
2.

Conference Proceedings
Conference Proceedings
2. Mosaic near-infrared focal plane array
Ichikawa,T. ; Itoh,N. ; Yanagisawa,K. ; Asai,K. ; Shiraishi,T. ; Kimata,M.
Pub. info.: Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii.  Part 1  pp.313-316,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3354
3.

Conference Proceedings
Conference Proceedings
3. Low-cost 320 x 240 uncooled IRFPA using a conventional silicon IC process
Ishikawa,T. ; Ueno,M. ; Endo,K. ; Nakaki,Y. ; Hata,H. ; Sone,T. ; Kimata,M. ; Ozeki,T.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.556-564,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
4.

Conference Proceedings
Conference Proceedings
4. 512 x 512-element GeSi/Si heterojunction infrared FPA
Wada,H. ; Nagashima,M. ; Hayashi,K. ; Nakanishi,J. ; Kimata,M. ; Kumada,N. ; Ito,S.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.584-595,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
5.

Conference Proceedings
Conference Proceedings
5. Performance of 320×240 uncooled IRFPA with SOI diode detectors
Ishikawa,T. ; Ueno,M. ; Nakaki,Y. ; Endo,K. ; Ohta,Y. ; Nakanishi,J. ; Kosasayama,Y. ; Yagi,H. ; Sone,T. ; Kimata,M.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.152-159,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
6.

Conference Proceedings
Conference Proceedings
6. Silicon infrared focal plane arrays
Kimata,M. ; Yagi,H. ; Ueno,M. ; Nakanishi,J. ; Ishikawa,T. ; Nakaki,Y. ; Kawai,M. ; Endo,K. ; Kosasayama,Y. ; Ohota,Y. ; Sugino,T. ; Sone,T.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.286-297,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
7.

Conference Proceedings
Conference Proceedings
7. PtSi FPA with improved CSD operation
Shiraishi,T. ; Yagi,H. ; Endo,K. ; Kimata,M. ; Ozeki,T. ; Kama,K. ; Seto,T.
Pub. info.: Infrared technology and applications XXII : 8-12 April 1996, Orlando, Florida.  pp.33-43,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2744
8.

Conference Proceedings
Conference Proceedings
8. PtSi Schottky-barrier infrared FPAs with CDS readout (Invited Paper)
Kimata,M. ; Ozeki,T. ; Nunoshita,M. ; Ito,S.
Pub. info.: Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland.  pp.212-223,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3179
9.

Conference Proceedings
Conference Proceedings
9. PtSi Schottky-barrier infared focal plane arrays (Invited Paper)
Kimata,M. ; Ozeki,T. ; Tsubouchi,N. ; Ito,S.
Pub. info.: Imaging system technology for remote sensing : 16-17 September 1998, Beijing, China.  pp.2-12,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3505