1.

Conference Proceedings
Conference Proceedings
1. Evolution of surface characteristics in material removal simulation with subaperture tools
Kim,S.-W. ; Jee,M.-K.
Pub. info.: Large lenses and prisms : 27-30 March 2001 London, UK.  pp.112-119,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4411
2.

Conference Proceedings
Conference Proceedings
2. Multipoint diffraction interferometry for 3D profilometry
Kim,S.-W. ; Kim,B.-C.
Pub. info.: Optical diagnostics for fluids, solids, and combustion : July 31-2 August 2001 San Diego, USA.  pp.179-186,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4448
3.

Conference Proceedings
Conference Proceedings
3. White light phase-shifting interferometry with self-compensation of PZT scanning errors
Kim,S.-W. ; Kang,M.-G. ; Lee,S.-Y.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.16-19,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
4.

Conference Proceedings
Conference Proceedings
4. Scanning projection grating moire topography
Oh,J.-T. ; Lee,S.-Y. ; Kim,S.-W.
Pub. info.: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.46-51,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3958
5.

Conference Proceedings
Conference Proceedings
5. White-light scanning interferometry for thickness measurement of thin film layers
Kim,G.-H. ; Kim,S.-W.
Pub. info.: Optical diagnostics for fluids/heat/combustion and photomechanics for solids : 21-23 July 1999, Denver, Colorado.  pp.239-246,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3783
6.

Conference Proceedings
Conference Proceedings
6. Rapid defect inspection of display devices with optical spatial filtering
Kim,S.-W. ; Yoon,D.-S.
Pub. info.: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.255-261,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3824
7.

Conference Proceedings
Conference Proceedings
7. Optical image encryption using interferometer
Kim,J.-Y. ; Kim,K.-J. ; Seo,D.-H. ; Kim,S.-W. ; Park,S.-J. ; Kim,S.-J.
Pub. info.: Optical pattern recognition XI : 26-27 April, 2000, Orlando, Florida.  pp.364-371,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4043
8.

Conference Proceedings
Conference Proceedings
8. Fully Three-dimensional simulator for pulse borehole radar using the hybrid FDTD/PSTD
Kim,S.-W. ; Kim,S.-Y.
Pub. info.: Subsurface sensing Technologies and Application II : 31 July-3 August 2000, San Diego, USA.  pp.524-534,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4129
9.

Conference Proceedings
Conference Proceedings
9. Accurate FDTD simulation of a GRP system
Hyun,S.-Y. ; Kim,S.-W. ; Kim,S.-Y.
Pub. info.: Subsurface sensing Technologies and Application II : 31 July-3 August 2000, San Diego, USA.  pp.566-573,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4129
10.

Conference Proceedings
Conference Proceedings
10. Compensation of phase change upon reflection in white light interferometry
Park,M.-C. ; Kim,S.-W.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.259-262,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223