1.

Conference Proceedings
Conference Proceedings
1. Single-beam recording and retrieving of sub-wavelength size optical information in a photorefractive crystal using near-field scanning optical microscopy
Kim,K.-Y. ; Kang,J. ; Lee,B.
Pub. info.: Photorefractive fiber and crystal devices : materials, optical properties, and applications VII, and optical data storage : 29-31 July 2001, San Diego, USA.  pp.238-245,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4459
2.

Conference Proceedings
Conference Proceedings
2. Challenge of 0.3-k1 lithography by optimizing NA/sigma,OAI,biasing,and BARC: practical approach to quarter-micron i-line process
Kim,K.-Y. ; Barnett,S. ; Shih,J.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.660-672,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
3.

Conference Proceedings
Conference Proceedings
3. Applications of optical fibers and near-field scanning optical microscope for photorefractive holograms
Lee,B. ; Yang,B. ; Kim,K.-Y. ; Park,N.
Pub. info.: Photorefractive fiber and crystal devices : materials, optical properties, and applications VI : 30-31 July 2000, San Diego, USA.  pp.204-213,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4110
4.

Conference Proceedings
Conference Proceedings
4. Recording and retrieving of multiplexed near-field holograms
Lee,B. ; Kim,K.-Y. ; Kang,J. ; Park,J.-H.
Pub. info.: Photorefractive fiber and crystal devices : materials, optical properties, and applications VII, and optical data storage : 29-31 July 2001, San Diego, USA.  pp.155-164,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4459
5.

Conference Proceedings
Conference Proceedings
5. Application of alternating PSM to sub-quarter-micrometer technology using i-line lithography
Kim,H.-E. ; Ahn,C.-N. ; Kim,K.-Y. ; Baik,K.-H.
Pub. info.: 15th Annual BACUS Symposium on Photomask Technology and Management.  pp.432-444,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2621
6.

Conference Proceedings
Conference Proceedings
6. Accurate overlay control for 0.30-ｦﾌm i-line lithography
Kim,K.-Y. ; Hur,I.-B. ; Jang,G.-J. ; Choi,S.-H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography X.  pp.379-387,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2725