1.

Conference Proceedings
Conference Proceedings
1. White-light scanning interferometry for thickness measurement of thin film layers
Kim,G.-H. ; Kim,S.-W.
Pub. info.: Optical diagnostics for fluids/heat/combustion and photomechanics for solids : 21-23 July 1999, Denver, Colorado.  pp.239-246,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3783
2.

Conference Proceedings
Conference Proceedings
2. Attractive Interactions of Vector Dark Solitons,
Kim,G.-H. ; Moon,H.-J. ; Lim,Y.-S. ; Lee,J.-H. ; Chang,J.-S.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part2  pp.812-813,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
3.

Conference Proceedings
Conference Proceedings
3. Lasing Image and Spectrum of Two Merging Ink doped Liquid Microdroplets,
Moon,H.-J. ; Kim,G.-H. ; Lee,J.-H. ; Chang,J.-S.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part2  pp.758-759,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
4.

Conference Proceedings
Conference Proceedings
4. Automatic inspection of geometric accuracy of optical fiber ferrules by machine vision
Kim,G.-H. ; Kim,S.-W. ; Lim,S.-G.
Pub. info.: Process Control and Inspection for Industry.  pp.39-43,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222