1.

Conference Proceedings
Conference Proceedings
1. Reliability of Cu/WN Thin Films Deposited on Low-Dielectric Constant SiOF ILD
Lee, Seoghyeong ; Kim, Dong Joon ; Yang, Sung-Hoon ; Park, Jeongwon ; Sohn, Seil ; Oh, Kyunghui ; Kim, Yong-Tae ; Park, Jong-Wan
Pub. info.: Low-dielectric constant materials IV : symposium held April 14-16, 1998, San Francisco, California, U.S.A..  pp.347-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 511
2.

Conference Proceedings
Conference Proceedings
2. Strontium Bismuth Tantalate-Based Ferroelectric Gate Field Effect Transistor With Yttrium Oxide as the Buffer Layer
Lim, Myoung-Ho ; Kalkur, T. S. ; Kim, Yong-Tae
Pub. info.: Ferroelectric thin films VI : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A..  pp.465-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 493