Gupta, P. ; Kahng, A. ; Kim, Y. ; Shah, S. ; Sylvester, D.
Pub. info.:
Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA. pp.61560U-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gupta, P. ; Kahng, A. B. ; Kim, Y. ; Sylvester, D.
Pub. info.:
Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA. pp.61560B-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.298-301, 2006. Uetikon-Zuerich. Trans Tech Publications
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.639-646, 1990. Pittsburgh, Pa.. Materials Research Society
Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A.. pp.101-108, 1990. Pittsburgh, Pa.. Materials Research Society
Medical Imaging 2006: Ultrasonic Imaging and Signal Processing. pp.61470W-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Feldman, R.D. ; Austin, R.F. ; Cesar, C.L. ; Islam, M.N. ; Soccolich, C.E. ; Kim, Y. ; Ourmazd, A.
Pub. info.:
Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.113-122, 1991. Pittsburgh, Pa.. Materials Research Society
Hong, J. ; Woo, C. ; Park, J. ; Cho, B. ; Choi, J.-S. ; Yang, H. ; Park, C. ; Shin, Y.-C. ; Kim, Y. ; Jeong, G. ; Kim, J. ; Kang, K. ; Kang, C. ; Yim, D. ; Song, Y.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.406-414, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering