1.

Conference Proceedings

Conference Proceedings
Gupta, P. ; Kahng, A. ; Kim, Y. ; Shah, S. ; Sylvester, D.
Pub. info.: Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA.  pp.61560U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6156
2.

Conference Proceedings

Conference Proceedings
Gupta, P. ; Kahng, A. B. ; Kim, Y. ; Sylvester, D.
Pub. info.: Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA.  pp.61560B-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6156
3.

Conference Proceedings

Conference Proceedings
Yu, E.G. ; Kim, Y. ; Kang, K.M. ; Chang, S.Y.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.298-301,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
4.

Conference Proceedings

Conference Proceedings
Ourmazd, A. ; Kim, Y.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.127-138,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
5.

Conference Proceedings

Conference Proceedings
Ourmazd, A. ; Kim, Y. ; Bode, M.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.639-646,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
6.

Conference Proceedings

Conference Proceedings
Kim, Y. ; Ourmazd, A. ; Feldman, R. D. ; Rentscheler, J.. A. ; Taylor, D. W. ; Austin, R. F.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.163-168,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
7.

Conference Proceedings

Conference Proceedings
Kim, Y. ; Ourmazd, A.
Pub. info.: Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A..  pp.101-108,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 184
8.

Conference Proceedings

Conference Proceedings
Yoo, Y. M. ; Coo, J. ; Koh, L. M. ; Kim, Y.
Pub. info.: Medical Imaging 2006: Ultrasonic Imaging and Signal Processing.  pp.61470W-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6147
9.

Conference Proceedings

Conference Proceedings
Feldman, R.D. ; Austin, R.F. ; Cesar, C.L. ; Islam, M.N. ; Soccolich, C.E. ; Kim, Y. ; Ourmazd, A.
Pub. info.: Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.113-122,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 216
10.

Conference Proceedings

Conference Proceedings
Hong, J. ; Woo, C. ; Park, J. ; Cho, B. ; Choi, J.-S. ; Yang, H. ; Park, C. ; Shin, Y.-C. ; Kim, Y. ; Jeong, G. ; Kim, J. ; Kang, K. ; Kang, C. ; Yim, D. ; Song, Y.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.406-414,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038