1.

Conference Proceedings
Conference Proceedings
1. New OPC methods to increase process margin for sub-70nm devices
Hong, J. -S. ; Kim, D. -H. ; Kim, S. -W. ; Yoo, M. -H. ; Kong, J. -T.
Pub. info.: Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA.  pp.302-312,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5756
2.

Conference Proceedings
Conference Proceedings
2. Catalyst degradation of polychlorinated biphenyls at low temperature
Lee, D. -K. ; Byun, E. -S. ; Cho, I. -C. ; Kim, S. -W.
Pub. info.: 12th International Congress on Catalysis : proceedings of the 12th ICC, Granada, Spain, July 9-14, 2000.  pp.1619-,  2000.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 130
3.

Conference Proceedings
Conference Proceedings
3. A scalable AND-ACC fingerprinting scheme for practical contents distribution [5960-103]
Seol, J. -M. ; Kim, S. -W.
Pub. info.: Visual Communications and Image Processing 2005.  pp.969-979,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5960
4.

Conference Proceedings
Conference Proceedings
4. Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples [6292-24]
Jao, K. -N. ; Kim, S. -W.
Pub. info.: Interferometry XIII: Techniques and Analysis.  pp.62920N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6292
5.

Conference Proceedings
Conference Proceedings
5. Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser [6292-25]
Jin, J. ; Kim, Y. -J. ; Kang, C. S. ; Kim, S. -W.
Pub. info.: Interferometry XIII: Techniques and Analysis.  pp.62920O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6292