Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.571-576, 1993. Pittsburgh, Pa.. Materials Research Society
Kim, Y.J. ; Noh, Y.M. ; Choi, S.C. ; Lee, C.K. ; Jung, J.S. ; Lee, H.L. ; Kim, J.E. ; Kim, K.W. ; Kim, M.J. ; He, Z. ; Ogunjobi, K. ; Lee, K.H.
Pub. info.:
Remote sensing in atmospheric pollution monitoring and control : 2 August 2004, Denver, Colorado, USA. pp.134-143, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Maracas, G.N. ; Shiralagi, K.T. ; Puechner, R.A. ; Yu, F. ; Choi, K.T. ; Bow, J.S. ; Ramamurti, R. ; Kim, M.J. ; Carpenter, R.W.
Pub. info.:
Low temperature (LT) GaAs and related materials : symposium held December 4-6, 1991, Boston, Massachusetts, U.S.A.. pp.271-276, 1992. Pittsburgh, Pa.. Materials Research Society
Rapid thermal processing : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.157-164, 1985. Pittsburgh, Pa.. Materials Research Society
Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.385-390, 1991. Pittsburgh, Pa.. Materials Research Society
Chemical perspectives of microelectric materials III : symposium held November 30-December 3, 1992, Boston, Massachusetts, U.S.A.. pp.471-480, 1993. Pittsburgh, Pa.. Materials Research Society
Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.. pp.325-332, 1986. Pittsburgh, Pa.. Materials Research Society
Singh, R.N. ; Brown, D.M. ; Kim, M.J. ; Smith, G.A.
Pub. info.:
Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.817-822, 1985. Pittsburgh, Pa.. Materials Research Society
Choi, E.S. ; Kim, Y.-J. ; Kim, M.J. ; Lee, C. ; Lee, B.H.
Pub. info.:
Coherence domain optical methods and optical coherence tomography in biomedicine VII : 27-29 January 2003, San Jose, California, USA. pp.154-162, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia. pp.319-325, 2005. Pennington, NJ. Electrochemical Society