1.

Conference Proceedings

Conference Proceedings
Nielsen, M.C. ; Kim, J.-Y. ; Rymaszewski, E.J. ; Lu, T.-M.
Pub. info.: Dielectric material integration for microelectronics.  pp.227-240,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-3
2.

Conference Proceedings

Conference Proceedings
Rymaszewski, E.J. ; Lu, T.-M. ; Nielsen, M.C. ; Kim, J.-Y.
Pub. info.: Dielectric material integration for microelectronics.  pp.216-226,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-3
3.

Conference Proceedings

Conference Proceedings
Seo, D.-H. ; Shin, C.-M. ; Kim, J.-Y. ; Kim, C.-S. ; Kim, J.-W. ; Kim, S.-J.
Pub. info.: Optical pattern recognition XIII : 2 April, 2002, Orlando, USA.  pp.82-89,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4734
4.

Conference Proceedings

Conference Proceedings
Kim, S. ; Lee, J. ; Park, J. ; Park, G. ; Lee, C. ; Son, D. ; Kim, J.-Y. ; Kim, S.-H. ; Yee, Y.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.5-13,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069
5.

Conference Proceedings

Conference Proceedings
Noh, C.-H. ; Kim, J.-Y. ; Lee, H.-C. ; Hwang, O.-C. ; Cho, S.-H. ; Song, K.-Y. ; Kim, J.-M.
Pub. info.: Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA.  pp.269-280,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5753(1)
6.

Conference Proceedings

Conference Proceedings
Kim, S.-C. ; Kim, Y.S. ; Lee, S.-H. ; Lee, M.-H. ; Kim, J.-Y.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.335-340,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069
7.

Conference Proceedings

Conference Proceedings
Rokhlin, S.I. ; Kim, J.-Y. ; Zoofan, B.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.132-146,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5045
8.

Conference Proceedings

Conference Proceedings
Kim, J.-Y. ; Jang, J.-Y. ; Kim, J.-H. ; Kim, K.
Pub. info.: Advances in Resist Technology and Processing XXIII.  pp.61532Z-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6153
9.

Conference Proceedings

Conference Proceedings
Chung, Y.-S. ; Kim, H.-J. ; Cho, S.-H. ; Lee, D.-H. ; Im, K.-H. ; Yim, Y.-G. ; Kim, D.-B. ; Kim, J.-Y.
Pub. info.: Advances in Resist Technology and Processing XIX.  Part Two  pp.660-670,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4690
10.

Conference Proceedings

Conference Proceedings
Lee, S.-S. ; Kim, J.-Y. ; Choi, S.-S. ; Lee, H.-S.
Pub. info.: Microwave and Optical Technology 2003.  pp.504-507,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5445