Seo, D.-H. ; Shin, C.-M. ; Kim, J.-Y. ; Kim, C.-S. ; Kim, J.-W. ; Kim, S.-J.
Pub. info.:
Optical pattern recognition XIII : 2 April, 2002, Orlando, USA. pp.82-89, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kim, S. ; Lee, J. ; Park, J. ; Park, G. ; Lee, C. ; Son, D. ; Kim, J.-Y. ; Kim, S.-H. ; Yee, Y.
Pub. info.:
Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada. pp.5-13, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Noh, C.-H. ; Kim, J.-Y. ; Lee, H.-C. ; Hwang, O.-C. ; Cho, S.-H. ; Song, K.-Y. ; Kim, J.-M.
Pub. info.:
Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.269-280, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kim, S.-C. ; Kim, Y.S. ; Lee, S.-H. ; Lee, M.-H. ; Kim, J.-Y.
Pub. info.:
Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada. pp.335-340, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.132-146, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering