1.

Conference Proceedings
Conference Proceedings
1. Improved Copper Chemical Vapor Deposition Process by Applying Substrate Bias
Lee, Won-Jun ; Rha, Sa-Kyun ; Lee, Seung-Yun ; Kim, Dong-Won ; Chun, Soung-Soon ; Park, Chong-Ook
Pub. info.: Advanced metallization for future ULSI : symposium held April 8-11, 1996, San Francisco, California, U.S.A..  pp.207-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 427
2.

Conference Proceedings
Conference Proceedings
2. Scanning tunneling spectroscopy investigation of the strained Si1-xGex-on-Si band offsets
Chen, Xiangdong ; Wang, Xiang-Dong ; Liu, Kou-Chen ; Kim, Dong-Won ; Banerjee, Sanjay
Pub. info.: Morphological and compositional evolution of heteroepitaxial semiconductor thin films : symposium held April 24-27, 2000, San Francisco, California.  pp.219-,  2000.  Warrendale, Pennsylvania..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 618
3.

Conference Proceedings
Conference Proceedings
3. The Characterization of Initial Growth of Polycrystalline Silicon Germanium Films on Zirconium Oxide
Kim, Dong-Won ; Prins, Freek ; Ko, Kil-Soo ; Lee, C.H. ; Kwong, Dim-Lee ; Banerjee, Sanjay
Pub. info.: Materials issues in novel si-based technology : symposium held November 26-28, 2001, Boston, Massachusetts, U.S.A..  pp.217-222,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 686
4.

Conference Proceedings
Conference Proceedings
4. Mapping of Surface Residual Stress Field by Laser Interferometry Using Stress Relaxation Method
Kim, Dong-Won ; Lee, Nak-Kyu ; Na, Kyung-Hoan ; Kwon, Dongil
Pub. info.: Surface engineering 2002 - synthesis, characterization and applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.361-366,  2003.  Warrendale, Penn.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 750
5.

Conference Proceedings
Conference Proceedings
5. Determination of Residual-Stress-Free State and Mapping of Residual Stress Fields Using Speckle Interferometry and Thermal Relaxation
Kim, Dong-Won ; Kim, Jong-jin ; Son, Dongil ; Lee, Nak-Kyu ; Na, Kyung-Hoan ; Kwon, Dongil
Pub. info.: Thin films : stresses and mechanical properties X : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.307-312,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 795