Kelemen, M.T. ; Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Kiefer, R. ; Walther, M. ; Mikulla, M. ; Weimann, G.
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Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.75-81, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sah, R.E. ; Baumann, H. ; Serries, D. ; Kiefer, R. ; Braunstein, J.
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Silicon nitride and silicon dioxide thin insulating films, proceedings of the fifth International Symposium. pp.26-37, 1999. Pennington, New Jersey. Electrochemical Society
Mikulla, M. ; Kelemen, M.T. ; Walther, M. ; Kiefer, R. ; Moritz, R. ; Weimann, G.
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APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina. pp.11-18, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Travas-Sejdic, J. ; Kiefer, R. ; Valiavalappil, S. ; Li, K. ; Kilmartin, P. A.
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Smart structures and materials 2006 : Electroactive polymer actuators and devices (EAPAD) : 27 February-2 March 2006, San Diego, California, USA. pp.61682I-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sah, R.E. ; Weimar, W. ; Baumann, H. ; Wagner, J. ; Kiefer, R. ; Muller, S.
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Proceedings of the twenty-sixth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXVI). pp.178-185, 1997. Pennington, NJ. Electrochemical Society
Mermelstein, C. ; Simanowski, S. ; Mayer, M. ; Kiefer, R. ; Schmitz, J. ; Walther, M. ; Wagner, J.
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Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.53-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Burkle, L. ; Fuchs, F. ; Kiefer, R. ; Pletschen, W. ; Sah, R. E. ; Schmitz, J.
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Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.77-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Mermelstein, C. ; Rattunde, M. ; Schmitz, J. ; Simanowski, S. ; Kiefer, R. ; Walther, M. ; Wagner, J.
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Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.365-376, 2002. Warrendale, Pa.. Materials Research Society
Kiefer, R. ; Jackson, C. ; Garg, V. ; Mellenthin, D. ; Manfredo, J. ; Buck, P. ; Cohen, S. ; Morgante, C. ; Allen, P. C. ; White, M.
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Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA. pp.315-326, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering