1.

Conference Proceedings
Conference Proceedings
1. Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods
Szilagyi, E. ; Khanh, N.Q. ; Horvath, Z.E. ; Lohner, T. ; Battistig, G. ; Zolnai, Z. ; Kotai, E. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.271-274,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
2.

Conference Proceedings
Conference Proceedings
2. Damage Distributions Induced by Channeling Implantation of Nitrogen into 6H Silicon Carbide
Zolnai, Z. ; Khanh, N.Q. ; Lohner, T. ; Ster, A. ; Kotai, E. ; Vickridge, I. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.645-648,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
3.

Conference Proceedings
Conference Proceedings
3. High-Sensitivity Ion Beam Analytical Method for Studying Ion-Implanted SiC
Battistig, G. ; Lopez, J.G. ; Khanh, N.Q. ; Morilla, Y. ; Respaldiza, M.A. ; Szilagyi, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.625-628,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436