1.

Conference Proceedings

Conference Proceedings
Regan,T.M. ; Harris,D.C. ; Stroud,R.M. ; White,J.R. ; Blodgett,D.W. ; Baldwin,K.C. ; Miragliotta,J.A. ; Thomas,M.E. ; Linevsky,M.J. ; Giles,J.W. ; Kennedy,T.A. ; Fatemi,M. ; Black,D.R. ; Lagerlof,K.P.D.
Pub. info.: Window and dome technologies and materials VII : 16-17 April 2001, Orlando, USA.  pp.31-40,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4375
2.

Conference Proceedings

Conference Proceedings
Glaser,E.R. ; Kennedy,T.A.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.775-786,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings

Conference Proceedings
Kennedy,T.A. ; Glaser,E.R. ; Klein,P.B. ; Bhargava,R.N.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.737-742,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings

Conference Proceedings
Carlos,W.E. ; Glaser,E.R. ; Kennedy,T.A. ; Nakamura,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.25-30,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201