1.

Conference Proceedings

Conference Proceedings
Murphy, D.F. ; Kennedy, A. ; Ray, M. ; Wyles, R. ; Wyles, J. ; Asbrock, J.F. ; Hewitt, C. ; Lue, D.V. ; Sessler, T. ; Anderson, J.S. ; Bradley, D. ; Chin, R. ; Gonzales, H. ; Pere, C.L. ; Kostrzewa, T.
Pub. info.: Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA.  pp.402-413,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5074
2.

Conference Proceedings

Conference Proceedings
Anderson, J.S. ; Bradley, D. ; Chen, C.W. ; Chin, R. ; Gonzalez, H. ; Hegg, R.G. ; Kostrzewa, K. ; Pere, C.L. ; Ton, S. ; Kennedy, A. ; Murphy, D.F. ; Ray, M. ; Wyles, R. ; Miller, J.E. ; Newsome, G.W.
Pub. info.: Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA.  pp.557-563,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5074
3.

Conference Proceedings

Conference Proceedings
Mclntosh, J. C. ; Kennedy, A. ; Clary, C.
Pub. info.: Algorithms for synthetic aperture radar imagery XII : 28-31 March, 2005, Orlando, Florida, USA.  pp.95-101,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5808
4.

Conference Proceedings

Conference Proceedings
Murphy, D. ; Ray, M. ; Kennedy, A. ; Wyles, J. ; Hewitt, C. ; Wyles, R. ; Gordon, E. ; Sessler, T. ; Baur, S. ; Van Lue, D. ; Anderson, S. ; Chin, R. ; Gonzalez, H. ; Le Pere, C. ; Ton, S. ; Kostrzewa, T.
Pub. info.: Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA.  pp.448-459,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5783
5.

Conference Proceedings

Conference Proceedings
Anderson, J.S. ; Bradley, D. ; Chen, C.W. ; Chin, R. ; Hegg, R.G. ; Kennedy, A. ; Murphy, D.F. ; Ray, M. ; Wyles, R. ; Brown, J.C. ; Newsome, G.W.
Pub. info.: Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA.  pp.107-112,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4719
6.

Conference Proceedings

Conference Proceedings
Murphy, D.F. ; Ray, M. ; Wyles, R. ; Asbrock, J.F. ; Lum, N.A. ; Wyles,J. ; Hewitt, C. ; Kennedy, A. ; Van Lue, D. ; Anderson, J.S. ; Bradley, D. ; Chin, R. ; Kostrzewa, T.
Pub. info.: Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA.  pp.99-110,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4721
7.

Conference Proceedings

Conference Proceedings
Radford, W. ; Wyles, R. ; Wyles, J. ; Varesi, J. ; Ray, M. ; Murphy, D. ; Kennedy, A. ; Finch, A. ; Moody, E. ; Cheung, F. ; Coda, R. ; Baur, S.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 2  pp.636-646,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
8.

Conference Proceedings

Conference Proceedings
Murphy, D.F. ; Ray, M. ; Wyles, R. ; Asbrock, J.F. ; Lum, N.A, ; Wyles, J. ; Hewitt, C. ; Kennedy, A. ; Van Lue, D. ; Anderson, J.S. ; Bradley, D. ; Chin, R. ; Kostrzewa, T.
Pub. info.: Infrared Technology and Applications XXVIII.  Part One  pp.208-219,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4820
9.

Conference Proceedings

Conference Proceedings
Murphy, D.F. ; Ray, M. ; Wyles, J. ; Asbrock, J.F. ; Hewitt, C. ; Wyles, R. ; Gordon, E. ; Sessler, T. ; Kennedy, A. ; Baur, S.T. ; Van Lue, D. ; Anderson, S. ; Chin, R. ; Gonzales, H. ; Le Pere, C. ; Ton, S. ; Kostrzewa, T.
Pub. info.: Infrared Technology and Applications XXX.  pp.531-540,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5406