1.

Conference Proceedings
Conference Proceedings
1. Extremely High-Density Capacitors with ALD High-k Dielectric Layers
Klootwijk, J. ; Kemmeren, A. ; Wolters, R. ; Roozeboom, F. ; Verhoeven, J. ; Van Den Heuvel, E.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.17-29,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. High-Density, Low-Loss MOS Capacitors for Integrated RF Decoupling
Roozeboom, F. ; Elfrink, R.J.G. ; Rijks, G.S.M., Th ; Verhoeven, J.F.C.M. ; Kemmeren, A. ; van den Meerakker, J.E.A.M.
Pub. info.: Proceedings : International Symposium on Advanced Packaging Materials : processes, properties and interfaces, Chateau Elan, Braselton, Georgia, March 11-14, 2001.  pp.477-483,  2001.  Washington, DC.  IMAPS
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4587
3.

Conference Proceedings
Conference Proceedings
3. High-Density, Low-Loss MOS Decoupling Capacitors Integrated in a GSM Power Amplifier
Roozeboom, F. ; Kemmeren, A. ; Verhoeven, J. ; van den Heuvel, E. ; Kretschman, H. ; Fric, T.
Pub. info.: Materials, integration and packaging issues for high-frequency devices.  pp.157-164,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 783