1.

Conference Proceedings
Conference Proceedings
1. Towards a solid state detector response function for AXAF calibration
Barnes,P.J. ; McDermott,W.C. ; Edgar,R.J. ; Kellogg,E.M.
Pub. info.: Space telescopes and instruments V : 25-28 March 1998, Kona, Hawaii.  Part 2  pp.1046-1056,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3356
2.

Conference Proceedings
Conference Proceedings
2. High-speed imager AXAF calibration microchannel plate detector
Evans,I.N. ; Kellogg,E.M. ; McDermott,W.C. ; Ordway,M.P. ; Rosenberg,J.M. ; Wargelin,B.J.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.18-29,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
3.

Conference Proceedings
Conference Proceedings
3. Absolute effective area of the Chandra high-resolution mirror assembly(HRMA)
Schwartz,D.A. ; David,L.P. ; Donnelly,R.H. ; Edgar,R.J. ; Gaetz,T.J. ; Graessle,D.E. ; Jerius,D. ; Juda,M. ; Kellogg,E.M. ; McNamara,B.R. ; Plucinsky,P.P. ; Speybroeck,L.P.Van ; Wargelin,B.J. ; Wolk,S. ; Dewey,D. ; Marshall,H.L. ; Schulz,N.S. ; Elsner,R.F. ; Kolodziejczak,J.J.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.28-40,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
4.

Conference Proceedings
Conference Proceedings
4. Absolute calibration of the Chandra X-ray Observatory:transfer standard solid state detectors
Serej,S.R. ; Kellogg,E.M. ; Edgar,R.J. ; Scholze,F. ; Ulm,C.
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.777-788,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3765
5.

Conference Proceedings
Conference Proceedings
5. AXAF HXDS germanium solid state detectors
McDermott,W.C. ; Kellogg,E.M. ; Wargelin,B.J. ; Evans,I.N. ; Vitek,S.A. ; Tsiang,E.Y. ; Schwartz,D.A. ; Edgar,R.J. ; Kraft,S. ; Scholze,F. ; Thornagel,R. ; Ulm,G. ; Weisskopf,M.C. ; O'Dell,S.L. ; Tennant,A.F. ; Kolodziejczak,J.J. ; Zirnstein,G.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.535-543,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
6.

Conference Proceedings
Conference Proceedings
6. Absolute calibration of the AXAF telescope effective area
Kellogg,E.M. ; Cohen,L.M. ; Edgar,R.J. ; Evans,I.N. ; Freeman,M.D. ; Gaetz,T.J. ; Jerius,D. ; McDermott,W.C. ; McKinnon,P.J. ; Murray,S.S. ; Podgorski,W.A. ; Schwartz,D.A. ; Van Speybroeck,L.P. ; Wargelin,B.J. ; Zombeck,M.V. ; Weisskopf,M.C. ; Elsner,R.F. ; O'Dell,S.L. ; Tennant,A.F. ; Kolodziejczak,J.J.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.515-525,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
7.

Conference Proceedings
Conference Proceedings
7. AXAF calibration: the HXDS flow proportional counters
Wargelin,B.J. ; Kellogg,E.M. ; McDermott,W.C. ; Evans,I.N. ; Vitek,S.A.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.526-534,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
8.

Conference Proceedings
Conference Proceedings
8. FIB 601 Focused ion beam fabrication of micron-sized apertures for the NASA AXAF x-ray telescope prelaunch calibration
Tsiang,E.Y. ; Kellogg,E.M. ; Porterfield,D.
Pub. info.: Microlithography and Metrology in Micromachining.  pp.100-110,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2640