Kelemen, M.T. ; Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Kiefer, R. ; Walther, M. ; Mikulla, M. ; Weimann, G.
Pub. info.:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.75-81, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mikulla, M. ; Kelemen, M.T. ; Walther, M. ; Kiefer, R. ; Moritz, R. ; Weimann, G.
Pub. info.:
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina. pp.11-18, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kelemen, M.T. ; Weber, J. ; Rinner, F. ; Rogg, J. ; Mikulla, M. ; Weimann, G.
Pub. info.:
Laser Diodes, Optoelectronic Devices, and Heterogenous Integration. pp.252-260, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering