1.

Conference Proceedings
Conference Proceedings
1. New approach for testing of aspherical micro-optics with high numerical aperture
Kebbel,V. ; Hartmann,H.-J. ; Juptner,W.P.O.
Pub. info.: Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA.  pp.345-355,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4451
2.

Conference Proceedings
Conference Proceedings
2. Application of digital holographic microscopy for inspection of micro-optical components
Kebbel,V. ; Hartmann,H.-J. ; Juptner,W.P.O.
Pub. info.: Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany.  pp.189-198,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4398
3.

Conference Proceedings
Conference Proceedings
3. Detection and compensation of misalignment for interferometric diagnostic tools applied in space-borne facilities
Kebbel,V. ; Hartmann,H.-J. ; Juptner,W.P.O. ; Schnars,U. ; Gatti,L. ; Becker,J.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part B  pp.468-476,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101
4.

Conference Proceedings
Conference Proceedings
4. Characterization of micro-optics using digital holography
Kebbel,V. ; Hartmann,H.-J. ; Juptner,W.P.O.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part B  pp.477-487,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101
5.

Conference Proceedings
Conference Proceedings
5. General appriach for the description of optical 3D measuring systems
Andra,P. ; Juptner,W.P. ; Kebbel,V. ; Osten,W.
Pub. info.: Videometrics V : 30-31 July 1997, San Diego, California.  pp.207-215,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3174