1.

Conference Proceedings
Conference Proceedings
1. Concentration And Stress Evolution During Electromigration In Passivated Al(0.25 at. % Cu) Conductor Lines
Kao, H. ; Cargill III, G. ; Hu, C.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D1.8-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
2.

Technical Paper
Technical Paper
2. Experimental Study of PCD Tool Performance in Drilling (AI2O3)p/6061 Metal Matrix Composites.
Ramulu, M. ; Rao, P.N. ; Kim, D. ; Kao, H.
Pub. info.: SME technical paper.  2003.  Society of Manufacturing Engineers