1.

Conference Proceedings
Conference Proceedings
1. Epitaxial InAs detectors optically immersed to GaAs microlenses
Kaniewski,J. ; Orman,Z. ; Piotrowski,J. ; Sioma,M. ; Ornoch,L. ; Romanis,M.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.721-729,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
2.

Conference Proceedings
Conference Proceedings
2. Stress-induced effects in semiconducting epitaxial layers
Bak-Misiuk,J. ; Domagala,J. ; Misiuk,A. ; Kaniewski,J. ; Adamczewska,J. ; Trela,J. ; Reginski,K. ; Dobosz,D. ; Prujszczyk,M. ; Tedenac,J.C.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.262-266,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
3.

Conference Proceedings
Conference Proceedings
3. Advanced InGaAs detectors on GaAs substrates
Kaniewski,J. ; Orman,Z. ; Piotrowski,J. ; Reginski,K. ; Romanis,M.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.749-759,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
4.

Conference Proceedings
Conference Proceedings
4. Hydregenation of deep defeet statcs in n-type Si coiltaining extended defects and transition metal(Ni or Fe)
Kaniewska,M. ; Kaniewski,J. ; Ornoch,L. ; Sekiguchi,T. ; Sumino,K.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.325-330,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Hydrogenation of copper related deep states in n-type Si containing extended defects
Kaniewski,J. ; Kaniewska,M. ; Omoch,L. ; Sekiguchi,T. ; Sumino,K.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.319-324,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings
Conference Proceedings
6. Au-Related Deep States in the Presence of Extended Defects in n-type Silicon
Kaniewska,M. ; Kaniewski,J. ; Peaker,A.R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1511-1516,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
7.

Conference Proceedings
Conference Proceedings
7. Interaction between Supersaturated Transition Metals(Cu,Ni,Fe)and Extended Defects in CZ-Si
Jablonski,J. ; Kaniewski,J. ; Kaniewska,M. ; Sekiguchi,T. ; Ornoch,L. ; Sumino,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1517-1522,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
8.

Conference Proceedings
Conference Proceedings
8. Reciprocal lattice mapping of InGaAs Layers grown on InP(001)and GaAs(001)substrates
Bak-Misiuk,J. ; Kaniewski,J. ; Domagata,J. ; Reginski,K. ; Adamczewska,J. ; Trela,J.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.47-52,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725