1.

Conference Proceedings
Conference Proceedings
1. SIMS study of atom migration in GaAs/AlGaAs quantum well laser structures
Kaniewska,M. ; Barcz,A. ; Krynska,D. ; Wesolowski,M.
Pub. info.: Laser technology VI : progress in lasers : 27 September-1 October 1999, Szczecin-Świnoujście, Poland.  pp.113-118,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4237
2.

Conference Proceedings
Conference Proceedings
2. Hydregenation of deep defeet statcs in n-type Si coiltaining extended defects and transition metal(Ni or Fe)
Kaniewska,M. ; Kaniewski,J. ; Ornoch,L. ; Sekiguchi,T. ; Sumino,K.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.325-330,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Hydrogenation of copper related deep states in n-type Si containing extended defects
Kaniewski,J. ; Kaniewska,M. ; Omoch,L. ; Sekiguchi,T. ; Sumino,K.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.319-324,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings
Conference Proceedings
4. Au-Related Deep States in the Presence of Extended Defects in n-type Silicon
Kaniewska,M. ; Kaniewski,J. ; Peaker,A.R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1511-1516,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings
Conference Proceedings
5. Interaction between Supersaturated Transition Metals(Cu,Ni,Fe)and Extended Defects in CZ-Si
Jablonski,J. ; Kaniewski,J. ; Kaniewska,M. ; Sekiguchi,T. ; Ornoch,L. ; Sumino,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1517-1522,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings
Conference Proceedings
6. GaAs/AIGaAs complex structures examined by photoreflectance spectroscopy
Sek,G. ; Misiewicz,J. ; Kaniewska,M. ; Reginski,K. ; Muszalski,J.
Pub. info.: Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland.  pp.137-140,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3179
7.

Conference Proceedings
Conference Proceedings
7. GRIN SCH SQW AIGaAs/GaAs lasers grown by molecular beam epitaxy:modeling and operating characteristics (Invited Paper)
Bugajski,M. ; Kaniewska,M. ; Reginski,K. ; Malag,A. ; Lepkowski,S. ; Muszalski,J.
Pub. info.: Laser Technology V: Physics and Research and Development Trends.  pp.310-323,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3186