1.

Conference Proceedings
Conference Proceedings
1. Novel single-layer chemically amplified resist for 193-nm lithography
Choi,S.-J. ; Kang,Y. ; Jung,D.-W. ; Park,C.-G. ; Moon,J.-T.
Pub. info.: Advances in resist technology and processing XIV : 10-12 March 1997, Santa Clara, California.  pp.104-112,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3049
2.

Conference Proceedings
Conference Proceedings
2. MEMS millimeter-wave reconfigurable components
Chiao,J.-C. ; Fu,Y. ; Chio,I.M. ; Cheng,S. ; Kang,Y.
Pub. info.: Terahertz and gigahertz photonics : 19-23 July 1999, Denver, Colorado.  pp.596-604,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3795
3.

Conference Proceedings
Conference Proceedings
3. Novel resst material for sub-100-nm contact hole pattern
Chung,J.-H. ; Choi,S.-J. ; Kang,Y. ; Woo,S.-G. ; Moon,J.-T.
Pub. info.: Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA.  Part1  pp.305-312,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3999
4.

Conference Proceedings
Conference Proceedings
4. Highly Linear photoreceiver design for application to ultrahigh-banwidth photonic A/D converters
Ralston,D. ; Metzger,A. ; Kang,Y. ; Asbeck,P.M. ; Yu,P.K.
Pub. info.: Radio frequency photonic devices and systems : 31 July-1 august 2000, San Diego, USA.  pp.132-140,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4112
5.

Conference Proceedings
Conference Proceedings
5. Improved digital speckle correlation method and its application in copper thin film
Wang,H.W. ; Kang,Y.
Pub. info.: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  pp.151-153,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4537
6.

Conference Proceedings
Conference Proceedings
6. Research and development in feature-based parametric modeling
Qian,X. ; Kang,Y. ; Xiang,W. ; Zhang,X. ; Zhou,J.
Pub. info.: Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China.  pp.422-427,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2644
7.

Conference Proceedings
Conference Proceedings
7. Development of resists for thermal flow process applicable to mass production
Kang,Y. ; Woo,S.-G. ; Choi,S.-J. ; Moon,J.-T.
Pub. info.: Advances in Resist Technology and Processing XVIII.  4345  pp.222-231,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4345
8.

Conference Proceedings
Conference Proceedings
8. Improved lithographic performance for resists based on polymers having a vinyl ether-maleic anhydride (VEMA) backbone
Tanaka,T. ; Choi,S.-J. ; Jung,D.-W. ; Lee,S. ; Lee,S.-H. ; Kang,Y. ; Woo,S.-G. ; Moon,J.-T. ; Kavanagh,R.J. ; Barclay,G.G. ; Orsula,G.W. ; Mattia,J. ; Caporale,S. ; Adams,T.G. ; Tanaka,T. ; Kang,D.
Pub. info.: Advances in Resist Technology and Processing XVIII.  4345  pp.119-130,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4345