Aspnes, D. E. ; Bhat, R. ; Colas, E. ; Florez, L. T. ; Gregory, S. ; Harbison, J. P. ; Kamiya, I. ; Quinn, W. E. ; Schwarz, S. A. ; Tanaka, H. ; Wassermeier, M.
Pub. info.:
Atomic layer growth and processing : symposium held April 29 - May 1, 1991, Anaheim, California, U.S.A.. pp.63-74, 1991. Pittsburgh. Materials Research Society
Disaster forewarning diagnostic methods and management : 13-14 and 16 November 2006, Goa, India. pp.64120K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hashizume, T. ; Kamiya, I. ; Hasegawa, Y. ; Ide, T. ; Pickering, H.W. ; Sakurai, T.
Pub. info.:
High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.. pp.297-302, 1989. Pittsburgh, Pa.. Materials Research Society
Tanaka, Ichiro ; Kawasaki, Eri ; Ohtsuki, O. ; Uno, K. ; Hara, M. ; Asami, H. ; Murase, T. ; Kamiya, I.
Pub. info.:
Quantum confined semiconductor nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.. pp.227-464, 2003. Warrendale, Pa.. Materials Research Society
Tanaka, Ichiro ; Kawasaki, Eri ; Ohtsuki, O. ; Hara, M. ; Asami, H. ; Kamiya, I.
Pub. info.:
Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. pp.467-472, 2002. Warrendale, Pa.. Materials Research Society