1.

Conference Proceedings
Conference Proceedings
1. ELECTRONS OF 3d TRANSITION METALS IN SILICON.
SIEVERTS,E.G. ; WEZEP,D.A.VAN ; KEMP,R.VAN ; AMMERLAAN,C.A.J.
Pub. info.: Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986.  Part2  pp.729-734,  1986.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 10-12
2.

Conference Proceedings
Conference Proceedings
2. THE ELECTRONIC STRUCTURE OF THE OXYGEN-VACANCY COMPLEX IN SILICON.
KEMP,R.VAN ; SIEVERTS,E.G. ; AMMERLAAN,C.A.J.
Pub. info.: Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986.  Part3  pp.875-880,  1986.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 10-12