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26 results

Conference Proceedings

1. Microscopic Understanding of PBTI and NBTI Mechanisms in High-κ / Metal Gate Stacks

M. Sato ; K. Yamabe ; K. Shiraishi ; S. Miyazaki ; K. Yamada

Pub. info.:	Physics and technology of high-k gate dielectrics 5. pp.615-627, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(4)

Conference Proceedings

2. Electronic Structure Analysis of Silicon Nanowires for High Conductivity in n- and p-channel Nanowire-FET

Y. Lee ; T. Nagata ; K. Kakushima ; K. Shiraishi ; H. Iwai

Pub. info.:	Solid State (General) - 214th ECS Meeting/PRiME 2008. pp.1-5, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(40)

Conference Proceedings

3. Origins of Negative Fixed Charge in Wet Oxidation for SiC

K. Kamiya ; Y. Ebihara ; K. Chokawa ; S. Kato ; K. Shiraishi

Pub. info.:	Silicon carbide and related materials 2012 : selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6,2012, St. Petersburg, Russian Federation. pp.409-412, 2013. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	740-742

Conference Proceedings

4. Asymmetric Distribution of Charge Trap in HfO₂-Based High-k Gate Dielectrics

K. Higuchi ; T. Naito ; A. Uedono ; K. Shiraishi ; K. Torii ; M. Boero ; T. Chikyow ; S. Yamosaki ; K. Yamada ; R. Hasumuma ; K. Yamabe

Pub. info.:	Physics and technology of high-k gate dielectrics III. pp.777-788, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(5)

Conference Proceedings

5. Influence of Long Period Stacking Ordered Phase on Non-Uniform Deformation in Cast Mg-Zn-Y Alloys

K. Shiraishi ; T. Mayama ; M. Yamasaki ; Y. Kawamura

Pub. info.:	High Performance Structural Material : Selected, peer reviewed papers from the Chinese Materials Congress 2014 (CMC 2014), July 4-7, 2014, Chengdu, China. pp.481-485, 2015. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	816

Conference Proceedings

6. Theory of Metal/Dielectric Interfaces -Breakdown of Schottky Barrier Limits-

K. Shiraishi ; T. Nakayama ; T. Nakaoka ; A. Ohta ; S. Miyazaki

Pub. info.:	Dielectrics for nanosystems 3: materials science, processing, reliability, and manufacturing. pp.21-27, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(2)

Conference Proceedings

7. Photoemission Study of Metal/HfSiON Gate Stack

S. Miyazaki ; H. Yoshinaga ; A. Ohta ; Y. Akasaka ; K. Shiraishi

Pub. info.:	Dielectrics for nanosystems 3: materials science, processing, reliability, and manufacturing. pp.67-73, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(2)

Conference Proceedings

8. Relation between Solubility of Silicon in High-k Oxides and the Effect of Fermi Level Pinning

N. Umezawa ; K. Shiraishi ; K. Kakushima ; H. Iwai ; K. Ohmori

Pub. info.:	Dielectrics for nanosystems 3: materials science, processing, reliability, and manufacturing. pp.15-20, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(2)

Conference Proceedings

9. Theoretical Study of N Incorporation Effect during SiC Oxidation

S. Kato ; K. Chokawa ; K. Kamaiya ; K. Shiraishi

Pub. info.:	Silicon carbide and related materials 2012 : selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6,2012, St. Petersburg, Russian Federation. pp.455-458, 2013. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	740-742

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Conference Proceedings

10. A New-Type of Defect Generation at a 4H-SiC/SiO₂ Interface by Oxidation Induced Compressive Strain

K. Chokawa ; S. Kato ; K. Kamaiya ; K. Shiraishi

Pub. info.:	Silicon carbide and related materials 2012 : selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6,2012, St. Petersburg, Russian Federation. pp.469-472, 2013. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	740-742

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Author: K. Shiraishi