1.

Conference Proceedings
Conference Proceedings
1. Mist Deposition for TFT Technology
K. Shanmugasundaram ; S. Price ; K. Chang ; D. Lee ; J. Ruzyllo
Pub. info.: Thin Film Transistor Technology 8.  pp.255-259,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(8)
2.

Conference Proceedings
Conference Proceedings
2. In-situ Synchrotron X-ray Spectroscopy of Ruthenium Nanoparticles Modified with Selenium for Oxygen Reduction Reaction
H. You ; J. Inukai ; A. Wieckowski ; K. Chang ; V. Komanicky
Pub. info.: Proton exchange membrane fuel cells 6.  pp.161-170,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(1)
3.

Conference Proceedings
Conference Proceedings
3. Wide Controllability of Flatband Voltage in La₂O₃ Gate Stack Structures-Remarkable Advantages of La₂O₃ over HfO₂
K. Ohmori ; P. Ahmet ; K. Shiraishi ; K. Yamabe ; H. Watanabe ; Y. Akasaka ; N. Umezawa ; K. Nakajima ; M. Yoshitake ; T. Nakayama ; K. Chang ; K. Kakushima ; Y. Nara ; M. L. Green ; H. Iwai ; K. Yamada ; T. Cchikyow
Pub. info.: Physics and technology of high-k gate dielectrics 4.  pp.351-362,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(3)
4.

Conference Proceedings
Conference Proceedings
4. A Combinatorial Study of Metal Gate/HfO₂ MOSCAPS
M. L. Green ; K. Chang ; I. Takeuchi ; T. Chikyow
Pub. info.: Physics and technology of high-k gate dielectrics 4.  pp.341-350,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(3)
5.

Conference Proceedings
Conference Proceedings
5. Stability and Dissolution of the Platinum Single Crystal Surfaces in Perchloric Acid
V. Komanicky ; K. Chang ; A. Menzel ; H. You ; X. Wang ; D. Myers ; N. Markovic
Pub. info.: Durability and reliability of low-temperature fuel cells systems.  pp.167-184,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(8)
6.

Conference Proceedings
Conference Proceedings
6. EFFECT OF SILICON SURFACE CONDITION ON FILM FORMATION USING MIST DEPOSITION
K. Shanmugasundaram ; K. Chang ; J. Ruzyllo
Pub. info.: Cleaning Technology in Semiconductor Device Manufacturing IX.  pp.105-110,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(3)
7.

Conference Proceedings
Conference Proceedings
7. SURFACE ROUGHNESS IN SILICON CARBIDE TECHNOLOGY
K. Chang ; T. Witt ; A. Hoff ; R. Woodin ; R. Ridley ; G. Dolny ; K. Shanmugasundaram ; E. Oborina ; J. Ruzyllo
Pub. info.: Cleaning Technology in Semiconductor Device Manufacturing IX.  pp.228-233,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(3)
8.

Conference Proceedings
Conference Proceedings
8. Multiple Nanowire Channel Poly-Si TFTs with Defect Passivation
T. Liao ; S. Tu ; W. Lin ; C. Liu ; K. Chang
Pub. info.: Student Posters (General) - 213th ECS Meeting.  pp.1-8,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 13(5)
9.

Conference Proceedings
Conference Proceedings
9. Combinatorial Methodology for the Exploration of Metal Gate Electrodes on HfO2 for the Advanced Gate Stack
K. Chang ; M. Green ; J.S. Suehle ; J. Hattrick-Simpers ; I. Takeuchi
Pub. info.: Dielectrics for nanosystems 3: materials science, processing, reliability, and manufacturing.  pp.151-159,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 13(2)
10.

Conference Proceedings
Conference Proceedings
10. A Study of Electrical Properties of SiGe Film with Various Oxidation Conditions
K. Chang ; J. Kuo ; H. Wu ; W. Tzeng ; T. Wu
Pub. info.: Student Posters (General).  pp.91-100,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(20)