1.

Conference Proceedings
Conference Proceedings
1. Leveling of Microvias by Electroplating for Wafer Level Packaging
O. Luehn ; J. Celis ; C. Van Hoof ; K. Baert ; W. Ruythooren
Pub. info.: Electrochemical Processing in ULSI and MEMS 3.  pp.123-133,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(8)
2.

Conference Proceedings
Conference Proceedings
2. Stress Analysis on Ultra Thin Ground Wafers
R. C. Teixeira ; K. DeMunck ; P. DeMoor ; K. Baert ; B. Swinnen ; C. Van Hoof ; A. Kuttel
Pub. info.: Microelectronics Technology and Devices : SBMICRO 2007.  pp.113-122,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 9(1)
3.

Conference Proceedings
Conference Proceedings
3. Photonic crystals for improved light harvesting
K. Clays ; B. Kolaric ; K. Baert ; R. A. L. Vallee
Pub. info.: Linear and nonlinear optics of organic materials VIII : 12-14 August 2008, San Diego, California, USA.  pp.70490J-1-70490J-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7049
4.

Conference Proceedings
Conference Proceedings
4. Photonic superlattices for photonic crystal lasers
K. Clays ; K. Baert ; M. Van der Auweraer ; R. Vallée
Pub. info.: Linear and nonlinear optics of organic materials VII : 28-30 August 2007, San Diego, California, USA.  pp.665302-1-665302-12,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6653
5.

Conference Proceedings
Conference Proceedings
5. Tuning of spontaneous emission in photonic crystals by resonant energy transfer and magnetic fields
W. Libaers ; K. Baert ; R. A. L. Vallée ; B. Kolaric ; K. Clays
Pub. info.: Photonic crystal materials and devices VIII : 8-10 April 2008, Strasbourg, France.  pp.69890N-1-69890N-12,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6989