1.

Conference Proceedings
Conference Proceedings
1. Analytical I-V description of thin-film SOI MOSFET with position-dependent mobility model
Jurczak, M. ; Jakubowski, A.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.259-264,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. High-k Dielectrics Integration Prospects (Invited paper)
Kubicek, S. ; Van Elshocht, S. ; Delabie, A. ; Yamamoto, K. ; Beckx, S. ; Claes, M. ; Van Hoornick, N. ; Kwak, D.-H. ; Hyun, S. ; Rothschild, A. ; Veloso, A. ; Anil, K. ; Lujan, G. ; Kittle, J.A. ; Lauwers, A. ; Kaushik, V. ; Niwa, M. ; De Gendt, S. ; Heyns, M. ; Jurczak, M. ; Biesemans, S.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.169-192,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06
3.

Conference Proceedings
Conference Proceedings
3. 61 Impact of Recessed S/D SiGe Integration Parameters on Device Performance
Washington, L. ; Nouri, F. ; Verheyen, P. ; Moroz, V. ; Kawaguchi, M. ; Kim, Y. ; Samoilov, A. ; Jurczak, M.
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium.  pp.515-522,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-05
4.

Conference Proceedings
Conference Proceedings
4. Impact of line width roughness on device performance [6152-32]
Lorusso, G. F. ; Leunissen, L. H. A. ; Gustin, C. ; Mercha, A. ; Jurczak, M. ; Marchman, H. M. ; Azordegan, A.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61520W-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152