1.

Conference Proceedings
Conference Proceedings
1. 46 Evaluation of CMOS gate metal materials using in situ characterization techniques
Cabral, C., Jr. ; Lavoje, C. ; Ozcan, A.S. ; Amos, R.S. ; Naroyanan, V. ; Gusev, E.P. ; Jordan-Sweet, J.L. ; Harpe, J.M.E.
Pub. info.: Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium.  pp.375-384,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-14
2.

Conference Proceedings
Conference Proceedings
2. Thermal Stability of Strained Si on Relaxed Si1-xGex Buffer Layers
Mooney, P.M. ; Koester, S.J. ; Ott, J.A. ; Jordan-Sweet, J.L. ; Chu, J.O. ; Chan, K.K.
Pub. info.: Materials issues in novel si-based technology : symposium held November 26-28, 2001, Boston, Massachusetts, U.S.A..  pp.3-8,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 686