Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA. pp.75-86, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks III. pp.96-105, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Independent Component Analyses, Wavelets, and Neural Networks. pp.56-68, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nonlinear Materials: Growth, Characterization, Devices, and Applications. pp.9-21, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks II. pp.32-40, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering