Sakellariou, A. ; Senden, T.J. ; Sawkins, T.J. ; Knackstedt, M.A. ; Turner, M.L. ; Jones, A.C. ; Saadatfar, M. ; Roberts, R.J. ; Limaye, A. ; Arns, C.H. ; Sheppard, A.P. ; Sok, R.M.
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Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.473-484, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Modreanu, M. ; Hurley, P.K. ; O'Sullivan, B.J. ; O'Looney, B. ; Senateur, J.-P. ; Rousell, H. ; Rousell, F. ; Audier, M. ; Dubourdieu, C. ; Boyd, I.W. ; Fang, Q. ; Leedham, T.L. ; Rushworth, S.A. ; Jones, A.C. ; Davies, H.O. ; Jimenez, C.
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Opto-Ireland 2002: Optics and Photonics Technologies and Applications. Part Two pp.1236-1246, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering